Features: 250 MHz OperationDriver/Comparator Included52-Lead LQFP Package with Built-in Heat SinkApplicationAutomatic Test EquipmentSemiconductor Test SystemsBoard Test SystemsInstrumentation and Characterization EquipmentPinoutSpecificationsPower Supply Voltage+VS to GND . . . . . . . . . . . . ....
AD53033: Features: 250 MHz OperationDriver/Comparator Included52-Lead LQFP Package with Built-in Heat SinkApplicationAutomatic Test EquipmentSemiconductor Test SystemsBoard Test SystemsInstrumentation and Ch...
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The AD53033 is a single chip that performs the pin electronicsfunctions of driver and comparator (D-C) in ATE VLSI andmemory testers.The driver is a proprietary design that features three activestates: Data High Mode, Data Low Mode and Term Mode aswell as an Inhibit State. This facilitates the implementation ofhigh speed active termination. The output voltage range is 3 Vto +8 V to accommodate a wide variety of test devices.
Theoutput leakage of AD53033 is typically less than 250 nA over the entire signalrange.Thedual comparator, with an input range equal to the driveroutput range, features built-in latches and ECL-compatibleoutputs. The outputs are capable of driving 50 W signal linesterminated to 2 V. Signal tracking capability is upwardsof5 V/ns.
Also included on the chip is an onboard temperature sensorwhose purpose is to give an indication of the surface temperatureof the D-C. This information can be used to measure qJCand qJA or flag an alarm if proper cooling is lost. Output from the