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ACS257MS

Features: • QML Qualified Per MIL-PRF-38535 Requirements• 1.25Micron Radiation Hardened SOS CMOS• Radiation Environment- Latch-up Free Under any Conditions- Total Dose . . . . . . . . . . . . . . . . . . . . .3 x 105 RAD(Si)- SEU Immunity . . . . . . . . . . <1 x 10-10 Errors/...

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SeekIC No. : 004267884 Detail

ACS257MS: Features: • QML Qualified Per MIL-PRF-38535 Requirements• 1.25Micron Radiation Hardened SOS CMOS• Radiation Environment- Latch-up Free Under any Conditions- Total Dose . . . . . . ...

ACS257MS Data Sheet

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Part Number:
ACS257MS
Supply Ability:
5000

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  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

• QML Qualified Per MIL-PRF-38535 Requirements
• 1.25Micron Radiation Hardened SOS CMOS
• Radiation Environment
- Latch-up Free Under any Conditions
- Total Dose . . . . . . . . . . . . . . . . . . . . .3 x 105 RAD(Si)
- SEU Immunity . . . . . . . . . . <1 x 10-10 Errors/Bit/Day
- SEU LET Threshold . . . . . . . . . . . >100MeV/(mg/cm2)
• Input Logic Levels .VIL = (0.3)(VCC), VIH = (0.7)(VCC)
• Output Current . . . . . . . . . . . . . . . . . . . . . . . . ±8mA
• Quiescent Supply Current. . . . . . . . . . . . . . . . 400A
• Propagation Delay
- Enable to Output . . . . . . . . . . . . . . . . . . . . . . . 13ns
- Input or Address to Output . . . . . . . . . . . . . . . 14ns


Application

• 4-Bit Source Selection
• Data Routing
• High Frequency Switching


Pinout

Connection Diagram


Description

The Radiation Hardened ACS257MS is a Quad 2-Channel multiplexer which selects four bits of data from one of two sources under the control of a single select pin. The Output Enable input is active LOW and controls all outputs. When OE is set HIGH, all outputs are configured into a high impedance state, regardless of all other input conditions. All inputs are buffered and the outputs are designed for balanced propagation delay and transition times.

The ACS257MS is fabricated on a CMOS Silicon on Sapphire (SOS) process, which provides an immunity to Single Event
Latch-up and the capability of highly reliable performance in any radiation environment. These devices offer significant
power reduction and faster performance when compared to ALSTTL types.




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