Specifications RATING SYMBOL Min Max UNIT VDD (3.3)VDD (1.8)VDD (1.2)VDDVI / VOIOTSTG DC supply voltage on 3.3 V pins with respect to VSSDC supply voltage on 1.8 V pins with respect to VSSDC supply voltage on 1.2 V pinswith respect to VSSDC supply voltageInput voltageOutput currentS...
82541PI: Specifications RATING SYMBOL Min Max UNIT VDD (3.3)VDD (1.8)VDD (1.2)VDDVI / VOIOTSTG DC supply voltage on 3.3 V pins with respect to VSSDC supply voltage on 1.8 V pins with respect t...
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RATING | SYMBOL | Min | Max | UNIT |
VDD (3.3) VDD (1.8) VDD (1.2) VDD VI / VO IO TSTG |
DC supply voltage on 3.3 V pins with respect to VSS DC supply voltage on 1.8 V pins with respect to VSS DC supply voltage on 1.2 V pinswith respect to VSS DC supply voltage Input voltage Output current Storage temperature range ESD per MIL_STD-883 Test Method 3015, Specification 2001V Latchup Over/Undershoot: 150 mA, 125 C |
VSS - 0.5 VSS - 0.5 VSS - 0.5 VSS - 0.5 VSS - 0.5 -40 |
4.6 2.5 orVDD(1.8) + 0.5b 1.7 orVDD(1.2) + 0.5c 4.6 4.6d 40 125 VDD overstress: VDD(3.3) * (7.2 V) |
V V V V V mA °C V |
a. Maximum ratings are referenced to ground (VSS). Permanent device damage is likely to occur if the ratings in this table are exceeded. These values should not be used as the limits for normal device operations.
b. The maximum value is the lesser value of 2.5 V or VDD(2.5) + 0.5 V. This specification applies to biasing the device to a steady state for an indefinite duration.
c. The maximum value is the lesser value of 1.7 V or VDD(2.5) + 0.5 V.
d. The maximum value must also be less than VIO.