High Speed Optocouplers 10MBd 1500Vdc Hermetically sealed
8102805PC: High Speed Optocouplers 10MBd 1500Vdc Hermetically sealed
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US $79.52 - 91.45 / Piece
Multi-Paired Cable 24AWG 2PR SHIELD 100ft SPOOL CHROME
US $670.18 - 856.07 / Piece
Multi-Paired Cable 24AWG 2PR SHIELD 1000ft SPOOL CHROME
Maximum Baud Rate : | 10 MBps | Maximum Forward Diode Voltage : | 1.9 V |
Maximum Reverse Diode Voltage : | 5 V | Maximum Power Dissipation : | 200 mW |
Maximum Operating Temperature : | + 125 C | Minimum Operating Temperature : | - 55 C |
Package / Case : | PDIP-8 |
The DSCC SMD 8102805PC is a high reliability Class H two channel hermetically sealed optocoupler in an 8-Pin ceramic DIP package with gold plated leads. Solder dipped leads and various lead form options are also available. See the datasheet for details. 8102805PC is appropriate for isolation voltage applications requiring up to 2500 Vdc.
8102805PC is capable of operation and storage over the full military temperature range and may also be purchased as commercial grade. 8102805PC are manufactured and tested on a MIL-PRF-38534 certified line and the Class H version is included in the DSCC Qualified Manufacturers List QML-38534 for Hybrid Microcircuits.
Each channel contains a GaAsP light emitting diode which is optically coupled to an integrated high speed photon detector. The output of the detector is an open collector Schottky clamped transistor. Internal shields provide a guaranteed common mode transient immunity specification of 1000 V/micro-second.
Because the same electrical die (emitters and detectors) are used for each channel of each device listed in the datasheet, absolute maximum ratings, recommended operating conditions, electrical specifications, and performance characteristics shown in the datasheet figures are virtually identical for all parts. Occasional exceptions exist due to package variations and limitations and are as noted. Additionally, the same package assembly processes and materials are used in 8102805PC. These similarities give justification for the use of data obtained from one part to represent other parts performance for reliability and certain limited radiation test results.