74ALVT162823

Features: • Two sets of high speed parallel registers with positive edge-triggered D-type flip-flops• 5V I/O Compatible• Ideal where high speed, light loading, or increased fan-in are required with MOS microprocessors• Live insertion/extraction permitted• Power-up 3-S...

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SeekIC No. : 004249490 Detail

74ALVT162823: Features: • Two sets of high speed parallel registers with positive edge-triggered D-type flip-flops• 5V I/O Compatible• Ideal where high speed, light loading, or increased fan-in ...

floor Price/Ceiling Price

Part Number:
74ALVT162823
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/11/24

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Product Details

Description



Features:

• Two sets of high speed parallel registers with positive
   edge-triggered D-type flip-flops
• 5V I/O Compatible
• Ideal where high speed, light loading, or increased fan-in are
   required with MOS microprocessors
• Live insertion/extraction permitted
• Power-up 3-State
• Power-up Reset
• Output capability: +12mA/12mA
• Latch-up protection exceeds 500mA per Jedec Std 17
• ESD protection exceeds 2000 V per MIL STD 883 Method 3015
   and 200 V per Machine Model
• Bus hold data inputs eliminate the need for external pull-up
   resistors to hold unused inputs
• Outputs include series resistance of 30W making external
   termination resistors unnecessary



Pinout

  Connection Diagram


Specifications

SYMBOL PARAMETER CONDITIONS RATING UNIT
VCC DC supply voltage 0.5 to +4.6 V
IIK DC input diode current VI < 0 50 mA
VI DC input voltage3 -0.5 to +7.0 V
IOK DC output diode current VO < 0 50 mA
VOUT DC output voltage3 Output in Off or High state -0.5 to +7.0 V
IOUT DC output current

output in Low state

128



mA
output in High state -64
Tstg Storage temperature range -65 to 150 °C


NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.




Description

The 74ALVT162823 18-bit bus interface register is designed to eliminate the extra packages required to buffer existing registers and provide extra data width for wider data/address paths of buses carrying parity.

The 74ALVT162823 has two 9-bit wide buffered registers with Clock Enable (nCE) and Master Reset (nMR) which are ideal for parity bus interfacing in high microprogrammed systems.

The registers of the 74ALVT162823 are fully edge-triggered. The state of each D input, one set-up time before the Low-to-High clock transition is transferred to the corresponding flip-flop's Q output.

The 74ALVT162823 is designed with 30W series resistance in both
the pull-up and pull-down output structures. This design reduces line
noise in applications such as memory address drivers, clock drivers,
and bus receivers/transmitters.




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