74ABT845N

DescriptionThe 74ABT845N belongs to 74ABT845 family which consists of eight D-type latches with 3-State outputs. In addition to the LE, OE, MR and PRE pins, and it has two additional OE pins, making a total of three Output Enable (OE0, OE1, OE2) pins. The multiple Output enables allow multiuser co...

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SeekIC No. : 004248781 Detail

74ABT845N: DescriptionThe 74ABT845N belongs to 74ABT845 family which consists of eight D-type latches with 3-State outputs. In addition to the LE, OE, MR and PRE pins, and it has two additional OE pins, making...

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Part Number:
74ABT845N
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/12/21

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Product Details

Description



Description

The 74ABT845N belongs to 74ABT845 family which consists of eight D-type latches with 3-State outputs. In addition to the LE, OE, MR and PRE pins, and it has two additional OE pins, making a total of three Output Enable (OE0, OE1, OE2) pins. The multiple Output enables allow multiuser control of the interface, e.g., CS, DMA, and RD/WR.

The features of 74ABT845N can be summarized as (1)high speed parallel latches; (2)ideal where high speed, light loading, or increased fan-in are required with MOS microprocessors; (3)broadside pinout; (4)output capability: +64mA/32mA; (5)power-up 3-state; (6)power-up reset; (7)latch-up protection exceeds 500mA per Jedec Std 17; (8)ESD protection exceeds 2000 V per MIL STD 883 Method 3015 and 200 V per machine model.

The absolute maximum ratings of 74ABT845N are (1)VCC DC supply voltage: -0.5 to +7.0V; (2)IIK DC input diode current (VI < 0): -18mA; (3)VI DC input voltage3: -1.2 to +7.0 V; (4)IOK DC output diode current(VO < 0): -50 mA; (5)VOUT DC output voltage3(output in off or high state): -0.5 to +5.5V; (6)IOUT DC output current(output in low state): 128mA; (7)Tstg storage temperature range: -65 to 150 °C.(1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit of the 74ABT845N should not exceed 150°C. 3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.).




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