6537

Test Probes BEADED PROBE T T

product image

6537 Picture
SeekIC No. : 002788280 Detail

6537: Test Probes BEADED PROBE T T

floor Price/Ceiling Price

Part Number:
6537
Mfg:
Pomona Electronics
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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268 Transactions

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Upload time: 2024/11/23

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Product Details

Description

Tip Style :
Equipment Type :


Features:

• Fast access times: 12, 15 and 20ns
• Fast OE# access times: 6, 7 and 8ns
• Single +5V +10% power supply
• Fully static -- no clock or timing strobes necessary
• All inputs and outputs are TTL-compatible
• Three state outputs
• Center power and ground pins for greater noise immunity
• JEDEC standard for functionality and revolutionary pinout
• Easy memory expansion with CE# and OE# options
• Automatic CE# power down
• High-performance, low-power consumption, CMOS double-poly, double-metal process



Pinout

  Connection Diagram


Specifications

Voltage on VCC Supply Relative to VSS........-0.5V to +7.0V
VIN ........................................................-0.5V to VCC+0.5V
Storage Temperature (plastic) .............. ...-55oC to +125o
Junction Temperature ..............................................+125o
Power Dissipation .....................................................1.2W
Short Circuit Output Current ....................................50mA
*Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device.This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.




Description

The 6537 is organized as a 524,288 x 8 SRAM using a four-transistor memory cell with a high performance, silicon gate, low-power CMOS process. Galvantech SRAMs are fabricated using double-layer polysilicon, double-layer metal technology.

The 6537 offers center power and ground pins for improved performance and noise immunity. Static design eliminates the need for external clocks or timing strobes. For increased system flexibility and eliminating bus contention problems, this device offers chip enable (CE#) and output enable (OE#) with this organization.

Writing to 6537 is accomplished when write enable (WE#) and chip enable (CE#) inputs are both LOW. Reading is accomplished when (CE#) and (OE#) go LOW with (WE#) remaining HIGH. The device offers a low power standby mode when chip is not selected. This allows system designers to meet low standby power requirements.




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