Test Probes TEST PROBE TO STRA
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Tip Style : | Spear | Equipment Type : | Test Probes |
Maximum Supply Voltage
45V
ON/OFF Pin Input Voltage
-0.3V <V< +Vin
Output Voltage to Ground
(Steady State) -1V
Power Dissipation
Internally Limited
Storage Temperature Range
-65 C to +150 C
Minimum ESD Rating
(C = 100pF, R = 1.5K Ohms) 3KV
Lead Temperature
(Soldering, 10 Sec.)
CERDIP 260 C
TO3 300 C
Maximum Junction Temperature
150 C
Thermal Resistance
ThetaJA
Metal Can (Still Air) 45 C/W
Metal Can (500LF/Min Air flow) 10 C/W
CERDIP (Still Air) 70 C/W
CERDIP (500LF/Min Air flow) 33 C/W
ThetaJC
Metal Can 3.3 C/W
CERDIP 2.0 C/W
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur.Operating Ratings indicate conditions for which the device is intended to be functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics.
The LM1575 regulator is a monolithic integrated circuit that provides all the active functions for a step-down (buck) switching regulator, capable of driving a 1A load with excellent line and load regulation.
Requiring a minimum number of external components, this regulator LM1575 is simple to use and includes internal frequency compensation and a fixed-frequency oscillator.
The LM1575 offers a high-efficiency replacement for popular three-terminal linear regulators. It substantially reduces the size of the heat sink, and in many cases no heat sink is required.
A standard series of inductors optimized for use with the LM1575 are available from several different manufacturers. This feature greatly simplifies the design of switch-mode power supplies.
Other features of LM1575 include a guaranteed +4% tolerance on output voltage within specified input voltage and output load conditions, and +10% on the oscillator frequency. External shutdown is included, featuring 50uA (typical) standby current. The output switch includes cycle-by-cycle current limiting, as well as thermal shutdown for full protection under fault conditions.