33LV408

*RAD-PAK(R)Technology radiation-hardened against natural space radiation
* 524,288 x 8 bit organization
· Total dose hardness: - > 100 krad (Si), depending upon space mission
* Excellent Single Event Effect  - SEL_TH: > 101 MeV/mg/cm²  - SEU_TH : = 3 MeV/mg/cm²  - SEU saturated cross section: 6E-9 cm /bit
* Package: - 32-Pin RAD-PAK(R) flat pack
* Fast access time: - 20, 25, 30 ns maximum times available
* Single 3.3V + 10% power supply
* Fully static operation - No clock or refresh required
* Three state outputs
* TTL compatible inputs and outputs
* Low power:  - Standby: 60 mA (TTL); 10 mA (CMOS) - Operation: 150 mA (20 ns); 140 mA (25 ns);  130 mA (30 ns)

Maxwell Technologies' 33LV408 high-density 4 Megabit SRAM microcircuit features a greater than 100 krad (Si) total dose tolerance, depending upon space mission. Using Max-well's radiation-hardened R_AD-P_AK^®packaging technology, the 33LV408 realizes a high density, high performance, and low power consumption. Its fully static design eliminates the need for external clocks, while the CMOS circuitry reduces power consumption and provides higher reliability. The 33LV408 is equipped with eight common input/output lines, chip select and output enable, allowing for greater system flexibility and eliminating bus contention. The 33LV408 features the same advanced 512K x 8-bit SRAM, high-speed, and low-power demand as the commercial counterpart.

Maxwell Technologies' patented R_AD-P_AK^®packaging technol-ogy incorporates radiation shielding in the microcircuit pack-age.  It eliminates the need for box shielding while providing the required radiation shielding for a lifetime in orbit or space mission.  In a GEO orbit, RAD -P AK(R) provides greater than 100 krad (Si) radiation dose tolerance. This product is available with screening up to Class S.