2SC3623

      The 2SC3623 is  designed for general-purpose applications requiring high DC cunrrent gain.This is suitable for all kind of driving,instead of darlington transistor,or muting.The 2SC3623 has 3 features including high DC current gain,hFE=1000 to 3200(@VCE=5.0V,IC=1.0mA);low collector saturation voltage,VCE(sat)=0.07 V TYP(@IC/IB=50mA/5.0mA);high VEBO:VEBO>12V.   
      The absolute maximun ratings at Ta=25°C, Collector to Base Voltage VCBO is 60 V;Collector to Emitter Voltage VCEO is 50 V;Emitter to Base Voltage VEBO is 12 V;Collector Current IC is 150 mA;Junction temperature +150°C maximum;Storage temperature is -55 to +150°C ;total power dissipation is 250mW etc.
      These capabilities make the 2SC3623 ideal for nonvolatile memory applications requiring frequent or rapid writes. Examples range from data collection where the number of write cycles may be critical, to demanding industrial controls where the long write time of EEPROM can cause data loss. The combination of features allows more frequent data writing with less overhead for the system. A Retriggerable one-shot multivibrator has an output pulse width which is extended on full time period (T) after application of the last trigger pulse. A Non-Retriggerable one-shot multivibrator has a time period (T) referenced from the application of the firs trigger pulse.
      This low failure rate represents data collected from Maxims reliability monitor program. In addition to routine production Burn-In, Maxim pulls a sample from every fabrication process three times per week and subjects it to an extended Burn-In prior to shipment to ensure its reliability. The reliability control level for each lot to be shipped as standard product is 59 F.I.T. at a 60% confidence level, which equates to 3 failures in an 80 piece sample. Maxim performs failure analysis on any lot that exceeds this reliability control level. Attached Burn-In Schematic (Spec. # 06-5856) shows the static Burn-In circuit. Maxim also performs quarterly 1000 hour life test monitors. This data is published in the Product Reliability Report (RR-1M).
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