2SA1315

Features: SpecificationsDescription The 2SA1315(TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process)) is used in power amplifier applications, power switching applications, and possesses high-speed switching time: tstg = 1.0 s (typ.), low collector saturation voltage: VCE (sat) = -0.5 V (ma...

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SeekIC No. : 004219927 Detail

2SA1315: Features: SpecificationsDescription The 2SA1315(TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process)) is used in power amplifier applications, power switching applications, and possesses high...

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Part Number:
2SA1315
Supply Ability:
5000

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  • 1~5000
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  • Negotiable
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  • 15 Days
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Description



Features:






Specifications






Description

      The 2SA1315(TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process)) is used in power amplifier applications, power switching applications, and possesses high-speed switching time: tstg = 1.0 s (typ.), low collector saturation voltage: VCE (sat) = -0.5 V (max) (IC = -1 A) , complementary to 2SC3328.
      Some parameters of the 2SA1315 are got at Ta(=25°C), VCBO(Collector-base voltage)=-80V, VCEO(Collector-emitter voltage)=-80V, VEBO(Emitter-base voltage)=-5V, IB(Continuous base current)=-1A, IC(Continuous collector current)=-2A, PC(Collector power dissipation)=900mW, Tstg(Storage temperature range)=-55 to 150°C, Tj(Junction temperature)=150°C. Some about the electrical properties of the 2SA1315 are also got at Ta(25°C), ICBO(Collector cut-off current, VCB =-80V, IE = 0)=-0.1A(Max), IEBO(Emitter cut-off current, VEB = -5V, IC = 0)=-0.1A, hFE (1)(VCE = -1 V, IC = -10 mA, R: 70 to 140, O: 120 to 240)=70(min)/240(max), hFE (2)(VCE = -2 V, IB = -1.5 A )=40(min), VCE (sat) (Collector-emitter saturation voltage, IC = -1A, IB = -50 mA)=-0.9(Typ.)/-0.5(Max)V, VBE(Base-emitter saturation voltage, IC = -1 A, IB = -0.05 A  )=-0.9V(Typ.)/-1.2(max)V, fT(Transition frequency, VCE = -2V, IC = -0.5A)=80(Typ.)MHz, Cob(Collector output capacitance, VCB = -10 V, IE = 0, f = 1 MHz)=45(Max)pF, ton(Turn-on time)/tstg(Storage time)/tf(Fall time)=0.2/1.0/0.2s(Typ.).
      Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause 2SA1315 to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).






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