Features: • Single supply with operation down to 2.5V• Supports Enhanced EDID™ (E-EDID™) 1.3• Completely implements DDC1™/DDC2™ interface for monitor identification, including recovery to DDC1• 2 Kbit Serial EEPROM Low-power CMOS technology:- 1 mA ac...
24LCS22A: Features: • Single supply with operation down to 2.5V• Supports Enhanced EDID™ (E-EDID™) 1.3• Completely implements DDC1™/DDC2™ interface for monitor identi...
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• Single supply with operation down to 2.5V
• Supports Enhanced EDID™ (E-EDID™) 1.3
• Completely implements DDC1™/DDC2™ interface for monitor identification, including recovery to DDC1
• 2 Kbit Serial EEPROM Low-power CMOS technology:
- 1 mA active current, typical
- 10A standby current, typical at 5.5V
• 2-wire serial interface bus, I2C™ compatible
• 100 kHz (2.5V) and 400 kHz (5V) compatibility
• Self timed write cycle (including auto-erase)
• Hardware write-protect pin
• Page write buffer for up to eight bytes
• 1,000,000 erase write cycles
• Data retention > 200 years
• ESD protection > 4000V
• 8-pin DIP and SOIC packages
• Available temperature ranges:
- Industrial (I) -40°C to +85°C
Parameter Name | Value |
Density | 2K bits (x8) |
Max. Clock Freq. | 400 kHz |
Page Size (bytes) | 8 |
Write Protect | Whole Array |
Endurance | 1,000,000 |
Op. Volt Range (V) | 2.5 to 5.5 |
Temp Range (°C) | -40°C to +85°C |
Absolute Maximum Ratings(†)
VCC........................................................................................................7.0V
All inputs and outputs w.r.t. VSS ................................... -0.6V to VCC +1.0V
Storage temperature ........................................................65°C to +150°C
Ambient temperature with power applied........................-40°C to +125°C
ESD protection on all pins .................................................................. 4 kV
† Notice: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at those or any other conditions above those
indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for
extended periods may affect device reliability.