Features: `Single-supply with operation down to 1.8V`Low-power CMOS technology:-1 mA active current, typical-1 standby current, typical at 5.5V`Organized as a single block of 128 bytes (128 x 8)`Hardware write protection for entire array`2-wire serial interface bus, I2CTM compatible`100 kHz and 4...
24LC014: Features: `Single-supply with operation down to 1.8V`Low-power CMOS technology:-1 mA active current, typical-1 standby current, typical at 5.5V`Organized as a single block of 128 bytes (128 x 8)`Ha...
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`Single-supply with operation down to 1.8V
`Low-power CMOS technology:
-1 mA active current, typical
-1 standby current, typical at 5.5V
`Organized as a single block of 128 bytes (128 x 8)
`Hardware write protection for entire array
`2-wire serial interface bus, I2CTM compatible
`100 kHz and 400 kHz clock compatibility
`Page write buffer for up to 16 bytes
`Self-timed write cycle (including auto-erase)
`5 ms max. write cycle time
`Address lines allow up to eight devices on bus
`1,000,000 erase/write cycles
`ESD protection > 4,000V
`Data retention > 200 years
`8-pin PDIP, SOIC, TSSOP, DFN and MSOP packages
`Available for extended temperature ranges:
-Industrial (I):-40 to+85
Parameter Name | Value |
Density | 1K bits (x8) |
Max. Clock Freq. | 400 kHz |
Page Size (bytes) | 16 |
Write Protect | Whole Array |
Endurance | 1,000,000 |
Op. Volt Range (V) | 2.5 to 5.5 |
Temp Range (°C) | -40°C to +85°C |
Absolute Maximum Ratings *
VCC...................................................................................................................6.5V
All inputs and outputs w.r.t. VSS ..............................................-0.6V to VCC +1.0V
Storage temperature......................................................................-65 to +150
Ambient temperature with power applied.......................................-65 to +125
ESD protection on all pins................................................................................ 4 kV
*NOTICE: Stresses above those listed under 'Absolute Maximum Ratings' may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at those or any other conditions above those
indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for
extended periods may affect device reliability.