IMD_TEST_CIRCUIT_FOR_PIN_DIODES

Published:2009/6/19 4:14:00 Author:May | From:SeekIC

A loosely coupled tuned circuit for testing IMD production by PIN and tuning diodes in a narrow-band preselector, S1, TUNING, selects whether C1 or a pair of back-to-back MV1650 tuning diodes resonate L1. S2, PIN, adds or removes an MPN3700 PIN diode in series with C1. L1 consists of 33 turns of #28 enameled wire on a t-37-6 toroidal powdered-iron core. The MV1650, a 20-V tuning diode, exhibits a nominal capacitance of 100 pF at a tuning voltage of 4V.



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