l00_MC_NOISE_FIGURE_TEST_SET

Published:2009/7/23 21:54:00 Author:Jessie | From:SeekIC

Used in measuring upper noise-corner frequency of transistors, by measuring small-signal short-circuit forward current transfer ratio (common emitter) h-fe or f-T.-Texas Instruments, Transistor Circuit Design, McGraw-Hill, N.Y., 1963, p 305.



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