Published:2009/7/22 22:20:00 Author:Jessie | From:SeekIC
Used in high-speed testing of ferrite cores, transistors, transformers, and other components requiring waveform measurement. Based on sampling of un known waveform at discrete intervals and comparing resulting digital output with that provided by perfect component.-B. Agusta, Sorting Components by Measuring Waveforms, Electronics, 32:7, p 56-59.
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