Published:2011/4/17 20:16:00 Author:Li xiao na From:SeekIC
Nowadays, the applications of the high power components become wider in the new energy and hybrid electric vehicle fields. Keithley Instruments Inc has developed the system source meter”2651A” which is especially designed to analyze the characteristics of the high power electronics and provide the broadest scale current. This scale current is very important for the different kinds of development, reliability and tests, such as to test the high brightness LED, power semiconductor, DC-AC converter, battery and the other material, component and module.
2651A has the high flexibility and current source, which also combined the precise voltmeter and am meter. This system source meter has integrated the functions of different kinds of devices, including the characteristic analyzer, EPOS, arbitrary waveform generator, impulse current or voltage generator, electronic load and the start on controller. The meter can be expanded to the synchronous system by the TSP-Link technique. Different from the other products, 2651A has 2000W of pulse power and 200W of the direct current power. Users can choose two modules of the 2651A, one is the digitized module, and the other is the integrating instrument. 2651A is used to analyze the precision.
Paralleling two units of 2651A by the TSP-Link technique can improve the current from 50A to 100A. This current is five times higher than the competitive scenario. Concatenating two units of 2651A also can improve the voltage from 40V to 80V. All the embedded test script processors in the 2600 series are able to regard many units as a single device to address; thus the test will be simplified. The start on controller of 2651A can synchronize the entire link channel’s work.. The functions of 2651A have provided the broadest dynamic raneg, which make 2651A very situable for the test of high current and power application, including the power semiconductor, HBLED, GaN, Sic and so on. The related integrated circuit is JAN1N3612.
Reprinted Url Of This Article: http://www.seekic.com/blog/IndustryNews/2011/04/17/Introduction_Of_The_New_System_Source_Meter.html
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